共 17 条
[1]
CAHKRADHAR S, 1997, IEEE T COMPUTER AIDE
[2]
Test width compression for built-in self testing
[J].
ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY,
1997,
:328-337
[3]
CHANDRA A, 2000, P IEEE VLSI TEST S
[6]
Gibson J.D., 1998, DIGITAL COMPRESSION
[7]
HAMZAOGLU I, 1998, P INT C COMP AID DES
[8]
COMPACT: A hybrid method for compressing test data
[J].
16TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS,
1998,
:62-69
[9]
Test vector decompression via cyclical scan chains and its application to testing core-based designs
[J].
INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS,
1998,
:458-464
[10]
JAS A, 1999, P IEEE AS TEST S