Influence of organic contamination on laser induced damage of multilayer dielectric mirrors by subpicosecond laser pulses

被引:7
作者
Favrat, O. [1 ]
Sozet, M. [1 ]
Tovena-Pecault, I. [1 ]
Lamaignere, L. [1 ]
Neauport, J. [1 ]
机构
[1] Ctr Etud Sci & Tech Aquitaine, Commissariat Energie Atom & Energies Alternat, F-33116 Le Barp, France
来源
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 2014 | 2014年 / 9237卷
关键词
Organic contamination; laser damage; multilayer dielectric mirror; subpicosecond laser pulses; VACUUM; COATINGS; THRESHOLD; IMPACT;
D O I
10.1117/12.2067902
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Laser induced damage of optical components is often a limiting factor for the development of high power lasers. Indeed, for many years, organic contamination is identified as a factor decreasing the laser induced damage threshold of optical surfaces, limiting the use of high fluencies. Also, for the development of its laser facilities, Laser MegaJoule and PETawatt Aquitaine Laser, the Commissariat a l'Energie Atomique et aux Energies Alternatives investigates the influence of organic contamination on the performances of the optical components. Actually, although great care is provided on the cleanliness of the optics, organic volatile compounds outgassed from surrounding materials can be adsorbed by the sensitive surfaces during its timelife. Thus, for this study, performances of clean and contaminated multilayer dielectric mirrors are compared. Contamination is intentionally realized either by controlled protocols or by exposing optics inside the laser facilities. Qualification and quantification of the organic contamination is realized by automated thermal desorption and gas chromatography coupled with mass spectrometry. Laser induced damage threshold of clean and contaminated mirrors are then investigated by 1053 nm laser at 670 fs.
引用
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页数:6
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共 20 条
  • [1] Experimental demonstration of a synthetic aperture compression scheme for multi-Petawatt high-energy lasers
    Blanchot, N.
    Bar, E.
    Behar, G.
    Bellet, C.
    Bigourd, D.
    Boubault, F.
    Chappuis, C.
    Coic, H.
    Damiens-Dupont, C.
    Flour, O.
    Hartmann, O.
    Hilsz, L.
    Hugonnot, E.
    Lavastre, E.
    Luce, J.
    Mazataud, E.
    Neauport, J.
    Noailles, S.
    Remy, B.
    Sautarel, F.
    Sautet, M.
    Rouyer, C.
    [J]. OPTICS EXPRESS, 2010, 18 (10): : 10088 - 10097
  • [2] Femtosecond laser-induced damage of HfO2/SiO2 mirror with different stack structure
    Chen, Shunli
    Zhao, Yuan'an
    Yu, Zhenkun
    Fang, Zhou
    Li, Dawei
    He, Hongbo
    Shao, Jianda
    [J]. APPLIED OPTICS, 2012, 51 (25) : 6188 - 6195
  • [3] Impact of organic contamination on laser-induced damage threshold of high reflectance coatings in vacuum
    Cui, Yun
    Zhao, Yuanan
    Yu, Hua
    He, Hongbo
    Shao, Jianda
    [J]. APPLIED SURFACE SCIENCE, 2008, 254 (18) : 5990 - 5993
  • [4] LASER-INDUCED BREAKDOWN BY IMPACT IONIZATION IN SIO2 WITH PULSE WIDTHS FROM 7 NS TO 150 FS
    DU, D
    LIU, X
    KORN, G
    SQUIER, J
    MOUROU, G
    [J]. APPLIED PHYSICS LETTERS, 1994, 64 (23) : 3071 - 3073
  • [5] Emmert L. A., 2010, P SOC PHOTO-OPT INS, V7842
  • [6] Study of organic contamination induced by outgassing materials. Application to the Laser MegaJoule optics
    Favrat, O.
    Mangote, B.
    Tovena-Pecault, I.
    Neauport, J.
    [J]. APPLIED SURFACE SCIENCE, 2014, 293 : 132 - 137
  • [7] Evaluation of the airborne molecular contamination inside the LIL
    Guéhenneux, G
    Veillerot, M
    Tovena, I
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2006, 557 (02) : 676 - 683
  • [8] The ultrafast excitation processes in femtosecond laser-induced damage in dielectric omnidirectional reflectors
    Jia, T. Q.
    Sun, H. Y.
    Li, X. X.
    Feng, D. H.
    Li, C. B.
    Xu, S. Z.
    Li, R. X.
    Xu, Z. Z.
    Kuroda, H.
    [J]. JOURNAL OF APPLIED PHYSICS, 2006, 100 (02)
  • [9] A study of the deterministic character of optical damage by femtosecond laser pulses and applications to nanomachining
    Joglekar, AP
    Liu, H
    Spooner, GJ
    Meyhöfer, E
    Mourou, G
    Hunt, AJ
    [J]. APPLIED PHYSICS B-LASERS AND OPTICS, 2003, 77 (01): : 25 - 30
  • [10] Keller M., 2012, INT S CONT CONTR ICC