Disentangling viscosity and hysteretic dissipative components in dynamic nanoscale interactions

被引:12
作者
Gadelrab, Karim R. [1 ]
Santos, Sergio [1 ]
Souier, Tewfik [1 ]
Chiesa, Matteo [1 ,2 ]
机构
[1] Masdar Inst Sci & Technol, Lab Energy & Nanosci, Abu Dhabi, U Arab Emirates
[2] MIT, Dept Mech Engn, Cambridge, MA 02139 USA
关键词
ATOMIC-FORCE MICROSCOPY; ENERGY-DISSIPATION; PHASE-CONTRAST; HEIGHT; IMAGES; PARTICLES; SCALE;
D O I
10.1088/0022-3727/45/1/012002
中图分类号
O59 [应用物理学];
学科分类号
摘要
The mechanisms through which energy is dissipated in nanoscale dynamic interactions might involve tens or hundreds of atoms and might be diverse. Here, a method is presented that provides the means to disentangle, with the use of common experimental parameters, short and long range viscosity and hysteretic dissipative components. While the approach is general, the experimental study is directed to show the mechanisms of energy dissipation between a silicon atomic force microscope tip and a carbon nanotube and a quartz surface. By stabilizing the tip in situ, quantitative information is found in a reproducible manner where the magnitude of energy dissipated remains constant in experiments thus allowing comparative studies.
引用
收藏
页数:5
相关论文
共 36 条
[1]   Factors affecting the height and phase images in tapping mode atomic force microscopy. Study of phase-separated polymer blends of poly(ethene-co-styrene) and poly(2,6-dimethyl-1,4-phenylene oxide) [J].
Bar, G ;
Thomann, Y ;
Brandsch, R ;
Cantow, HJ ;
Whangbo, MH .
LANGMUIR, 1997, 13 (14) :3807-3812
[2]   NANOTRIBOLOGY - FRICTION, WEAR AND LUBRICATION AT THE ATOMIC-SCALE [J].
BHUSHAN, B ;
ISRAELACHVILI, JN ;
LANDMAN, U .
NATURE, 1995, 374 (6523) :607-616
[3]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[4]   Optimizing phase imaging via dynamic force curves [J].
Chen, X ;
Davies, MC ;
Roberts, CJ ;
Tendler, SJB ;
Williams, PM ;
Burnham, NA .
SURFACE SCIENCE, 2000, 460 (1-3) :292-300
[5]   Energy dissipation in tapping-mode atomic force microscopy [J].
Cleveland, JP ;
Anczykowski, B ;
Schmid, AE ;
Elings, VB .
APPLIED PHYSICS LETTERS, 1998, 72 (20) :2613-2615
[6]   EFFECT OF CONTACT DEFORMATIONS ON ADHESION OF PARTICLES [J].
DERJAGUIN, BV ;
MULLER, VM ;
TOPOROV, YP .
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1975, 53 (02) :314-326
[7]  
Fischer-Cripps A.C., 2004, NANOINDENTATION
[8]   Identification of nanoscale dissipation processes by dynamic atomic force microscopy [J].
Garcia, R. ;
Gomez, C. J. ;
Martinez, N. F. ;
Patil, S. ;
Dietz, C. ;
Magerle, R. .
PHYSICAL REVIEW LETTERS, 2006, 97 (01)
[9]   Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy [J].
García, R ;
San Paulo, A .
PHYSICAL REVIEW B, 1999, 60 (07) :4961-4967
[10]  
GARCIA R, 2007, AFM FUNDAMENTALS FRI, V4, P361