Modeling of power supply noise in large chips using the circuit-based finite-difference time-domain method

被引:27
作者
Choi, J [1 ]
Swaminathan, M
Do, N
Master, R
机构
[1] Adv Microelect Devices, Sunnyvale, CA 94088 USA
[2] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
关键词
chip-package interaction; circuit finite-difference time-domain (FDTD); decoupling capacitor; large chips; on-chip power distribution; power supply noise; wafer level package;
D O I
10.1109/TEMC.2005.851719
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, a multilayered on-chip power distribution network consisting of two million passive elements has been modeled using the finite-difference time-domain (FDTD) method. In this method, a branch capacitor has been used. The use of the branch capacitor is important for simulating multilayered power grids. In addition, a method for including the CMOS inverter characteristics into the FDTD simulation has been presented. As an example of the application of this method, an H-tree clock network was simulated to compute the power supply noise distribution across an entire chip. Various scenarios with varying decoupling capacitances, load capacitances, number of clock buffers, and rise times have been analyzed to demonstrate the importance of circuit nonlinearity on power supply noise. Also, a method has been presented for analyzing package and board planes. Based on the methods presented, the interaction between chip and package has been discussed for capturing the resonant behavior that is otherwise absent when each section of the system is analyzed separately.
引用
收藏
页码:424 / 439
页数:16
相关论文
共 32 条
  • [1] [Anonymous], 1999, INT TECHNOLOGY ROADM
  • [2] *ANS CORP, 2001, ANSOFT MAXW 3D US MA
  • [3] BATTERYWALA SH, 1998, P 1998 IEEE INT S CI, V6, P82
  • [4] CHAUDHRY R, 2000, 13 INT C VLSI DES JA, P151
  • [5] Cheng JS, 1998, BIOM HLTH R, V21, P3
  • [6] Choi J, 2002, ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING, P257, DOI 10.1109/EPEP.2002.1057927
  • [7] Choi J, 2002, 2002 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, VOLS 1 AND 2, SYMPOSIUM RECORD, P238, DOI 10.1109/ISEMC.2002.1032481
  • [8] CHOI JS, 1999, IEEE 8 TOP M EL PERF, P157
  • [9] Chua L. O., 1975, COMPUTER AIDED ANAL
  • [10] Modeling of simultaneous switching noise in high speed systems
    Chun, S
    Swaminathan, M
    Smith, LD
    Srinivasan, J
    Jin, Z
    Iyer, MK
    [J]. IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2001, 24 (02): : 132 - 142