A system for ultra-fast transient ion and pulsed laser current microscopies as a function of temperature

In this paper we detail the new Transient Ion Beam Induced Current (TIBIC) and Transient Laser Beam Induced Current (TLBIC) measurement system developed at JAERI, Takasaki. Both measurements are performed in the same chamber as a function of sample temperature. The primary purpose of the chamber and data collection system is for the detailed investigation of ultra fast charge collection processes which give rise to Single Event Phenomenon (SEP) in radiation hard environments such as space. The system caters for both ultra-fast and relatively slow transient measurements as a function of temperature from 77K to 450K. The control system, implemented in the Labview environment, allows single ion scanning and transient acquisition on a range of oscilloscopes, for an array of temperatures and biases. The modularity of the system allows its use in a broad range of experiments, ranging from Single Event Upset (SEU) Transient Current measurements to Scanning Ion Deep Level Transient Spectroscopy (SIDLTS) charge transient measurements. Here we describe the overall system and illustrate the systems potential under several markedly different experimental configurations.