Induced reflection in Tamm plasmon systems

被引：58

作者：

Lu, Hua ^{[1
,2
]}

Li, Yangwu ^{[1
,2
]}

Jia, Han ^{[1
,2
]}

Li, Zhiwen ^{[1
,2
]}

Ma, Dong ^{[1
,2
]}

Zhao, Jianlin ^{[1
,2
]}

机构：

[1] Northwestern Polytech Univ, Sch Sci, MOE Key Lab Mat Phys & Chem Extraordinary Condit, Xian 710072, Shaanxi, Peoples R China

[2] Northwestern Polytech Univ, Sch Sci, Shaanxi Key Lab Opt Informat Technol, Xian 710072, Shaanxi, Peoples R China

来源：

OPTICS EXPRESS | 2019年 / 27卷 / 04期

基金：

中国国家自然科学基金;

关键词：

ELECTROMAGNETICALLY INDUCED TRANSPARENCY; COHERENT PERFECT ABSORPTION; POLARITONS; ANALOG; RESONANCES; ABSORBER; STATES; MODES; LIGHT;

D O I：

10.1364/OE.27.005383

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present an induced reflection response analogue to electromagnetically induced transparency (EIT) in a novel Tamm plasmon system, consisting of a thin metal film and a Bragg grating with a defect layer. The results show that an induced narrow peak can be generated in the original broad reflection dip, which is attributed to the coupling and interference between the Tamm plasmon and defect modes in the grating structure. It is found that the EIT-like induced reflection is strongly dependent on the thickness of defect layer, grating period number between the metal and defect layers, thickness of Bragg grating layer, refractive index of defect layer, and thickness of metal film. Additionally, the induced reflection can be dynamically tuned by adjusting the angle of incident light. The numerical simulations agree extremely well with theoretical calculations. The coupling strength between the Tamm plasmon and defect modes is determined by the above parameters. These results will provide a new avenue for light field control and devices in multilayer photonic systems. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

引用

页码：5383 / 5392

页数：10

共 69 条

[1] Classical analog of electromagnetically induced transparency [J].