Research of design for system-level testability and system partition

被引:0
|
作者
Li, TG [1 ]
Huang, KL [1 ]
Lian, GY [1 ]
Wang, BL [1 ]
机构
[1] Ordnance Engn Coll, Dept Missile Engn, Shijiazhuang 05003, Peoples R China
关键词
design for system-level testability; system partition; fuzzy directed graph;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
With the development of science and technology, the system structure and function of various equipments are more and more diversiform, the technology is more complex and the structure is more compositive. So it is very difficult to master the technology of faults detect and isolation. In the face of this challenge, design for system-level testability has become the most important method to raise the optimal rate between performance and price in the whole life span period of product. This article introduces the theory of design for system-level testability and system partition based on fuzzy directed graph theory, and lastly points out the improvement.
引用
收藏
页码:242 / 245
页数:4
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