A single-shot intensity-position monitor for hard X-ray FEL sources

被引：35

作者：

Feng, Yiping ^{[1
]}

Feldkamp, Jan M. ^{[1
]}

Fritz, David M. ^{[1
]}

Cammarata, Marco ^{[1
]}

Robert, Aymeric ^{[1
]}

Caronna, Chiara ^{[1
]}

Lemke, Henrik T. ^{[1
]}

Zhu, Diling ^{[1
]}

Lee, Sooheyong ^{[1
]}

Boutet, Sebastien ^{[1
]}

Williams, Garth ^{[1
]}

Tono, Kensuke ^{[2
]}

Yabashi, Makina ^{[2
]}

Hastings, Jerome B. ^{[1
]}

机构：

[1] SLAC Natl Accelerator Lab, Linac Coherent Light Source, 2575 Sand Hill Rd, Menlo Pk, CA 94025 USA

[2] SPring 8 RIKEN, Mikazuki, Hyogo 6795148, Japan

来源：

X-RAY LASERS AND COHERENT X-RAY SOURCES: DEVELOPMENT AND APPLICATIONS IX | 2011年 / 8140卷

关键词：

LCLS; hard X-rays; SASE; FEL; single-shot; intensity-position monitor; inline; FREE-ELECTRON LASER; RADIATION; NOISE;

D O I：

10.1117/12.893740

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An inline diagnostics device was developed to measure the intrinsic shot-to-shot intensity and position fluctuations of the SASE-based LCLS hard X-ray FEL source. The device is based on the detection of back-scattered X-rays from a partially-transmissive thin target using a quadrant X-ray diode array. This intensity and position monitor was tested for the first time with FEL X-rays on the XPP instrument of the LCLS. Performance analyses showed that the relative precision for intensity measurements approached 0.1% and the position sensitivity was better than 5 mu m, limited only by the Poisson statistics of the X-rays collected in a single shot.

引用

页数：6

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