Preparation of aluminium-doped ZnO films by helicon-wave excited plasma sputtering

被引:0
|
作者
Yamaki, Y [1 ]
Yamaya, K [1 ]
Araya, H [1 ]
Nakanishi, H [1 ]
Chichibu, S [1 ]
机构
[1] Sci Univ Tokyo, Fac Sci & Technol, Noda, Chiba 2788510, Japan
来源
BLUE LASER AND LIGHT EMITTING DIODES II | 1998年
关键词
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暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Predominantly c[0001]-axis oriented aluminium-doped or undoped ZnO thin films were deposited using the helicon-wave excited plasma (HWP) as a sputtering source. The ZnO:Al thin films grown on soda-lime glass substrates exhibited narrow (0002) x-ray diffraction (XRD) peak with full width at half maximum (FWHM) of 0.29 deg. The ZnO:Al thin film deposited at 300 degrees C showed low resistivity of 5 x 10-4 Omega . cm without any additional annealings. Moreover, high optical transmittance greater than 85% was achieved in the visible spectral wavelengths. The HWP-sputtering method is expected as one of the versatile techniques for the preparation of semiconductor thin films.
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页码:48 / 51
页数:4
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