Vision-based Mura detection for TFT-LCD panel

被引：0

作者：

Kwak, DM ^{[1
]}

Kim, WS ^{[1
]}

Choi, DH ^{[1
]}

Song, YC ^{[1
]}

Park, KH ^{[1
]}

机构：

[1] Kyungpook Natl Univ, Sch Elect Engn & Comp Sci, Taegu 702701, South Korea

来源：

CCCT 2003, VOL 4, PROCEEDINGS: COMPUTER, COMMUNICATION AND CONTROL TECHNOLOGIES: I | 2003年

关键词：

inspection; LCD; Mura; DFB;

D O I：

暂无

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

In this paper, an automated inspection algorithm for the detection of Mura defects in TFT-LCD panel is presented. Considering simplicity, Mura defects of TFT-LCD panel are classified into blob-Mura and line-Mura. To detect blob-Mura, we use an adapted multilevel-thresholding technique in local area of preprocessed image which brightness varies nonlinearly. DFB (Directional Filter Bank) is also used to find line-Mura. The experimental results using 60 sample images show that the proposed algorithm gave promising results for applying automated inspection technique for TFT-LCD panel.

引用

页码：199 / 203

页数：5

共 50 条

[21] Detection of Conductive Particles in TFT-LCD Circuit Using Generative Adversarial Networks [J].

Wang, Yuanyuan ;

Ma, Ling ;

Jiu, Mingyuan ;

Jiang, Huiqin .

IEEE ACCESS, 2020, 8 :101338-101350

[22] Double-faced TFT-LCD having one LC panel and one lighting system [J].

Taguchi, T ;

Tsuda, K ;

Itoh, Y ;

Kimura, N .

JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, 2005, 13 (08) :633-637

[23] Image restoration for quantifying TFT-LCD defect levels [J].

Choi, Kyu Nam ;

Park, No Kap ;

Yoo, Suk In .

IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2008, E91D (02) :322-329

[24] Technology and product trends of color TFT-LCD module [J].

Nishida, S ;

Hirai, Y ;

Sukegawa, O ;

Ueno, T .

NEC RESEARCH & DEVELOPMENT, 2001, 42 (03) :255-261

[25] Analysis and improvement of TFT-LCD horizontal stripes defect [J].

Wang Chao ;

Yao Zhi-Xiao .

CHINESE JOURNAL OF LIQUID CRYSTALS AND DISPLAYS, 2019, 34 (05) :477-481

[26] Air Liquide Supplies TFT-LCD Makers with Gases [J].

China Chemical Reporter, 2009, 20 (18) :11-11

[27] Robust defect detection method for a non-periodic TFT-LCD pad area [J].

Lee, Jeong-Yun ;

Kim, Tai-Wook ;

Pahk, Heui Jae .

INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, 2017, 18 (08) :1093-1102

[28] Optical residual stress measurement in TFT-LCD panels [J].

Wang, Wei-Chung ;

Sung, Po-Chi .

OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION X, 2017, 10329

[29] A Hybrid Method of Frequency and Spatial Domain Techniques for TFT-LCD Circuits Defect Detection [J].

Xia, Yan ;

Luo, Chen ;

Zhou, Yijun ;

Jia, Lei .

IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2023, 36 (01) :45-55

[30] Defect Classification of TFT-LCD with Bag of Visual Words Approach [J].

Huang, Wei ;

Lu, Hongtao .

2012 IEEE 6TH INTERNATIONAL CONFERENCE ON INFORMATION AND AUTOMATION FOR SUSTAINABILITY (ICIAFS2012), 2012, :167-170

← 1 2 3 4 5 →