Vision-based Mura detection for TFT-LCD panel

被引:0
作者
Kwak, DM [1 ]
Kim, WS [1 ]
Choi, DH [1 ]
Song, YC [1 ]
Park, KH [1 ]
机构
[1] Kyungpook Natl Univ, Sch Elect Engn & Comp Sci, Taegu 702701, South Korea
来源
CCCT 2003, VOL 4, PROCEEDINGS: COMPUTER, COMMUNICATION AND CONTROL TECHNOLOGIES: I | 2003年
关键词
inspection; LCD; Mura; DFB;
D O I
暂无
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
In this paper, an automated inspection algorithm for the detection of Mura defects in TFT-LCD panel is presented. Considering simplicity, Mura defects of TFT-LCD panel are classified into blob-Mura and line-Mura. To detect blob-Mura, we use an adapted multilevel-thresholding technique in local area of preprocessed image which brightness varies nonlinearly. DFB (Directional Filter Bank) is also used to find line-Mura. The experimental results using 60 sample images show that the proposed algorithm gave promising results for applying automated inspection technique for TFT-LCD panel.
引用
收藏
页码:199 / 203
页数:5
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