SiO line emission from C-type shock waves:: interstellar jets and outflows

被引:177
作者
Gusdorf, A. [1 ,2 ]
Cabrit, S. [3 ]
Flower, D. R. [1 ]
Forets, G. Pineau des [2 ,3 ,4 ,5 ]
机构
[1] Univ Durham, Dept Phys, Durham DH1 3LE, England
[2] IAS, F-91405 Orsay, France
[3] Observ Paris, LERMA UMR CNRS 8112, F-75014 Paris, France
[4] Univ Paris Sud 11, Paris, France
[5] CNRS, UMR 8617, F-75700 Paris, France
关键词
astrochemistry; atomic processes; magnetohydrodynamics (MHD); molecular processes; radiative transfer; shock waves;
D O I
10.1051/0004-6361:20078900
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
We study the production of SiO in the gas phase of molecular outflows, through the sputtering of Si-bearing material in refractory grain cores, which are taken to be olivine. We calculate also the rotational line spectrum of the SiO. The sputtering is driven by neutral particle impact on charged grains, in steady-state C-type shock waves, at the speed of ambipolar diffusion. The emission of the SiO molecule is calculated by means of an LVG code. A grid of models, with shock speeds in the range 20 < v(s) < 50 km s(-1) and preshock gas densities 104 < n(H) < 106 cm(-3), has been generated. We compare our results with those of an earlier study ( Schilke et al. 1997). Improvements in the treatment of the coupling between the charged grains and the neutral fluid lead to narrower shock waves and lower fractions of Si (less than or similar to 10%) being released into the gas phase. Erosion of grain cores is significant (greater than or similar to 1%) only for C-type shock speeds v(s) > 25 km s(-1), given the adopted properties of olivine. More realistic assumptions concerning the initial fractional abundance of O-2 lead to SiO formation being delayed, so that it occurs in the cool, dense postshock flow. Good agreement is obtained with recent observations of SiO line intensities in the L1157 and L1448 molecular outflows. The inferred temperature, opacity, and SiO column density in the emission region differ significantly from those estimated by means of LVG "slab" models. The fractional abundance of SiO is deduced and found to be in the range 4 x 10(-8) less than or similar to n( SiO)/n(H) less than or similar to 3 x 10(-7). Observed line profiles are wider than predicted and imply multiple, unresolved shock regions within the beam.
引用
收藏
页码:809 / 829
页数:21
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