Rapid structure determination of disordered materials:: study of GeSe2 glass

被引：21

作者：

Petkov, V

Qadir, D

Shastri, SD

机构：

[1] Cent Michigan Univ, Dept Phys, Mt Pleasant, MI 48859 USA

[2] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

来源：

SOLID STATE COMMUNICATIONS | 2004年 / 129卷 / 04期

基金：

美国国家科学基金会;

关键词：

GeSe2; X-ray scattering; glass structure;

D O I：

10.1016/j.ssc.2003.10.007

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

X-ray diffraction experiments on GeSe2 glass employing an imaging Plate detector system have been carried out and their performance compared to that of traditional experiments employing point-type detectors. Imaging Plate detectors have been found to perform very well delivering good quality data for just a second. The analysis of the experimental data shows that the atomic ordering in GeSe2 glass bears many of the characteristics of a random network of Ge-Se-4 tetrahedra. (C) 2003 Elsevier Ltd. All rights reserved.

引用

页码：239 / 243

页数：5

共 15 条

[11] PDFFIT, a program for full profile structural refinement of the atomic pair distribution function [J].