Comparing different approaches to characterization of focused X-ray laser beams

被引：51

作者：

Chalupsky, J. ^{[1
,2
]}

Bohacek, P. ^{[1
]}

Hajkova, V. ^{[1
]}

Hau-Riege, S. P. ^{[3
]}

Heimann, P. A. ^{[4
]}

Juha, L. ^{[1
]}

Krzywinski, J. ^{[5
]}

Messerschmidt, M. ^{[5
]}

Moeller, S. P. ^{[5
]}

Nagler, B. ^{[5
]}

Rowen, M. ^{[5
]}

Schlotter, W. F. ^{[5
]}

Swiggers, M. L. ^{[5
]}

Turner, J. J. ^{[5
]}

机构：

[1] Acad Sci Czech Republic, Inst Phys, Prague 18221, Czech Republic

[2] Czech Tech Univ, Fac Nucl Sci & Phys Engn, CR-11519 Prague 8, Czech Republic

[3] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

[4] Univ Calif Berkeley, Lawrence Berkeley Lab, Berkeley, CA 94720 USA

[5] SLAC Natl Accelerator Lab, Menlo Pk, CA 94025 USA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2011年 / 631卷 / 01期

关键词：

X-ray laser; X-ray ablation; Beam focusing; Beam characterization; Beam profile measurement; FREE-ELECTRON LASER; RADIATION; REGION;

D O I：

10.1016/j.nima.2010.12.040

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

X-ray lasers represent a powerful tool to explore matter under extreme conditions. A rigorous characterization of their output parameters is, therefore, of substantial importance for the purposes of the experiments being conducted at these sources. A profound knowledge of the spatial, temporal, spectral, statistical, coherence, and wavefront beam properties may protect us from an unwanted misinterpretation of the experimental data. We present an experimental technique of the spatial (transverse and longitudinal) characterization of the beam profile. Investigating ablative imprints in various materials, we evaluate the spatial properties of the incident beam, namely, the beam waist radius and position, the Rayleigh range, M(2) parameter, and divergence. In this paper, we recall briefly our recent work at the transverse beam profile reconstruction. A newly developed method of the longitudinal beam profile characterization is the main subject of this work. (C) 2010 Elsevier B.V. All rights reserved.

引用

页码：130 / 133

页数：4

共 15 条

[1] Generation of GW radiation pulses from a VUV free-electron laser operating in the femtosecond regime -: art. no. 104802 [J].

Ayvazyan, V ;

Baboi, N ;

Bohnet, I ;

Brinkmann, R ;

Castellano, M ;

Castro, P ;

Catani, L ;

Choroba, S ;

Cianchi, A ;

Dohlus, M ;

Edwards, HT ;

Faatz, B ;

Fateev, AA ;

Feldhaus, J ;

Flöttmann, K ;

Gamp, A ;

Garvey, T ;

Genz, H ;

Gerth, C ;

Gretchko, V ;

Grigoryan, B ;

Hahn, U ;

Hessler, C ;

Honkavaara, K ;

Hüning, M ;

Ischebeck, R ;

Jablonka, M ;

Kamps, T ;

Körfer, M ;

Krassilnikov, M ;

Krzywinski, J ;

Liepe, M ;

Liero, A ;

Limberg, T ;

Loos, H ;

Luong, M ;

Magne, C ;

Menzel, J ;

Michelato, P ;

Minty, M ;

Müller, UC ;

Nölle, D ;

Novokhatski, A ;

Pagani, C ;

Peters, F ;

Pflüger, J ;

Piot, P ;

Plucinski, L ;

Rehlich, K ;

Reyzl, I .

PHYSICAL REVIEW LETTERS, 2002, 88 (10) :4

[2] Predicting the coherent X-ray wavefront focal properties at the Linac Coherent Light Source (LCLS) X-ray free electron laser [J].

Barty, Anton ;

Soufli, Regina ;

McCarville, Tom ;

Baker, Sherry L. ;

Pivovaroff, Michael J. ;

Stefan, Peter ;

Bionta, Richard .

OPTICS EXPRESS, 2009, 17 (18) :15508-15519

[3] Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids [J].

Chalupsky, J. ;

Juha, L. ;

Kuba, J. ;

Cihelka, J. ;

Hajkova, V. ;

Koptyaev, S. ;

Krasa, J. ;

Velyhan, A. ;

Bergh, M. ;

Caleman, C. ;

Hajdu, J. ;

Bionta, R. M. ;

Chapman, H. ;

Hau-Riege, S. P. ;

London, R. A. ;

Jurek, M. ;

Krzywinski, J. ;

Nietubyc, R. ;

Pelka, J. B. ;

Sobierajski, R. ;

Meyer-ter-Vehn, J. ;

Tronnier, A. ;

Sokolowski-Tinten, K. ;

Stojanovic, N. ;

Tiedtke, K. ;

Toleikis, S. ;

Tschentscher, T. ;

Wabnitz, H. ;

Zastrau, U. .

OPTICS EXPRESS, 2007, 15 (10) :6036-6043

[4]

Emma P, 2010, NAT PHOTONICS, V4, P641, DOI [10.1038/nphoton.2010.176, 10.1038/NPHOTON.2010.176]

[5] Soft-x-ray free-electron-laser interaction with materials [J].

Hau-Riege, Stefan P. ;

London, Richard A. ;

Chapman, Henry N. ;

Bergh, Magnus .

PHYSICAL REVIEW E, 2007, 76 (04)

[6] Demonstration of a desk-top size high repetition rate soft x-ray laser [J].

Heinbuch, S ;

Grisham, M ;

Martz, D ;

Rocca, JJ .

OPTICS EXPRESS, 2005, 13 (11) :4050-4055

[7] Development of multilayer laminar-type diffraction gratings to achieve high diffraction efficiencies in the 1-8 keV energy region [J].

Ishino, Masahiko ;

Heimann, Philip A. ;

Sasai, Hiroyuki ;

Hatayama, Masatoshi ;

Takenaka, Hisataka ;

Sano, Kazuo ;

Gullikson, Eric M. ;

Koike, Masato .

APPLIED OPTICS, 2006, 45 (26) :6741-6745

[8] Global optimization of high harmonic generation -: art. no. 193901 [J].

Kazamias, S ;

Douillet, D ;

Weihe, F ;

Valentin, C ;

Rousse, A ;

Sebban, S ;

Grillon, G ;

Augé, F ;

Hulin, D ;

Balcou, P .

PHYSICAL REVIEW LETTERS, 2003, 90 (19) :193901/1-193901/4

[9]

Kirm M, 2005, PHYS STATUS SOLIDI C, V2, P649, DOI 10.1002/pssc.200460255

[10] Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser [J].

Krzywinski, J. ;

Sobierajski, R. ;

Jurek, M. ;

Nietubyc, R. ;

Pelka, J. B. ;

Juha, L. ;

Bittner, M. ;

Letal, V. ;

Vorlicek, V. ;

Andrejczuk, A. ;

Feldhaus, J. ;

Keitel, B. ;

Saldin, E. L. ;

Schneidmiller, E. A. ;

Treusch, R. ;

Yurkov, M. V. .

JOURNAL OF APPLIED PHYSICS, 2007, 101 (04)

← 1 2 →