Imaging High-Energy Electrons Propagating in a Crystal

被引:16
作者
Etheridge, Joanne [1 ,2 ]
Lazar, Sorin [3 ,4 ,5 ]
Dwyer, Christian [1 ,2 ,6 ]
Botton, Gianluigi A. [4 ,5 ]
机构
[1] Monash Univ, Monash Ctr Elect Microscopy, Clayton, Vic 3800, Australia
[2] Monash Univ, Dept Mat Engn, Clayton, Vic 3800, Australia
[3] FEI Elect Opt, NL-5600 KA Eindhoven, Netherlands
[4] McMaster Univ, Dept Mat Sci & Engn, Hamilton, ON, Canada
[5] McMaster Univ, Canadian Ctr Elect Microscopy, Hamilton, ON, Canada
[6] Monash Univ, ARC Ctr Excellence Design Light Met, Clayton, Vic 3800, Australia
基金
加拿大自然科学与工程研究理事会; 澳大利亚研究理事会;
关键词
RESOLUTION; SCATTERING; SCALE; ATOMS;
D O I
10.1103/PhysRevLett.106.160802
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
It has recently become possible to focus a beam of high-energy electrons to a spot smaller than an atom, with vast potential for the study of condensed matter. We devise an experiment that can image, with subangstrom resolution, the distribution of such an electron beam as it scatters within an atomic lattice. Our experiments reveal the acute sensitivity of the scattered electron distribution to 0.1 angstrom shifts of the impact point. Scattering due to plasmon excitations is also examined. Implications for the study of the atomic and electronic structure of condensed matter are discussed.
引用
收藏
页数:4
相关论文
共 24 条
  • [1] High-resolution detection of Au catalyst atoms in Si nanowires
    Allen, Jonathan E.
    Hemesath, Eric R.
    Perea, Daniel E.
    Lensch-Falk, Jessica L.
    Li, Z. Y.
    Yin, Feng
    Gass, Mhairi H.
    Wang, Peng
    Bleloch, Andrew L.
    Palmer, Richard E.
    Lauhon, Lincoln J.
    [J]. NATURE NANOTECHNOLOGY, 2008, 3 (03) : 168 - 173
  • [2] SYMMETRY-SELECTED ELECTRON-ENERGY-LOSS SCATTERING IN DIAMOND
    BATSON, PE
    [J]. PHYSICAL REVIEW LETTERS, 1993, 70 (12) : 1822 - 1825
  • [3] Sub-angstrom resolution using aberration corrected electron optics
    Batson, PE
    Dellby, N
    Krivanek, OL
    [J]. NATURE, 2002, 418 (6898) : 617 - 620
  • [4] Scattering of Å-scale electron probes in silicon
    Dwyer, C
    Etheridge, J
    [J]. ULTRAMICROSCOPY, 2003, 96 (3-4) : 343 - 360
  • [5] Dwyer C, 2001, INST PHYS CONF SER, P127
  • [6] Atomic-Resolution Imaging with a Sub-50-pm Electron Probe
    Erni, Rolf
    Rossell, Marta D.
    Kisielowski, Christian
    Dahmen, Ulrich
    [J]. PHYSICAL REVIEW LETTERS, 2009, 102 (09)
  • [7] Free-standing graphene at atomic resolution
    Gass, Mhairi H.
    Bangert, Ursel
    Bleloch, Andrew L.
    Wang, Peng
    Nair, Rahul R.
    Geim, A. K.
    [J]. NATURE NANOTECHNOLOGY, 2008, 3 (11) : 676 - 681
  • [8] A spherical-aberration-corrected 200 kV transmission electron microscope
    Haider, M
    Rose, H
    Uhlemann, S
    Schwan, E
    Kabius, B
    Urban, K
    [J]. ULTRAMICROSCOPY, 1998, 75 (01) : 53 - 60
  • [9] Electron microscopy image enhanced
    Haider, M
    Uhlemann, S
    Schwan, E
    Rose, H
    Kabius, B
    Urban, K
    [J]. NATURE, 1998, 392 (6678) : 768 - 769
  • [10] Heggen M, 2010, NAT MATER, V9, P332, DOI [10.1038/nmat2713, 10.1038/NMAT2713]