Tunable SEU-Tolerant Latch

被引：7

作者：

She, Xiaoxuan ^{[1
]}

Li, N. ^{[2
]}

Farwell, W. Darresware ^{[3
]}

机构：

[1] Fudan Univ, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China

[2] Gpix Inc, Orlando, FL 33816 USA

[3] RAY Co, Charlotte, NC USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2010年 / 57卷 / 06期

关键词：

Hardened by design; latch; radiation effects; single event upset (SEU); SOFT ERRORS; DELAY; RELIABILITY;

D O I：

10.1109/TNS.2010.2087358

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a single event upset (SEU) hardened latch that can mitigate SEU pulses having a width less than T, where T is the longest anticipated duration of SEUs. The propose latch includes a controllable inertial delay inverter. In order to mitigate SEUs with pulse widths less than T, a global controller uses delay locked loops to control the rise and fall times of the controllable inertial delay inverter in each latch to be equal to T. This allows T to be adjustable for different applications and environmental conditions. This technique introduces little area penalty and does not adversely affect propagation delay.

引用

页码：3787 / 3794

页数：8

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