Near infra-red radiation squeezing through 20 nm voids in obliquely deposited metal films

被引:3
作者
Smith, GB [1 ]
Hossain, AKM [1 ]
Gentle, A [1 ]
机构
[1] Univ Technol Sydney, Dept Appl Phys, Broadway, NSW 2007, Australia
关键词
D O I
10.1063/1.1359489
中图分类号
O59 [应用物理学];
学科分类号
摘要
Obliquely deposited metal films which are nearly continuous, displaying several unexpected solar optical properties. Transmittance intensity, spectral character, preferred direction of incidence, and polarization sensitivity, infer processes which effective-medium models based solely on "interior" properties cannot describe. Amplified transmittance through voids around 20 nm wide involving near surface excitations can explain the data. (C) 2001 American Institute of Physics.
引用
收藏
页码:2143 / 2144
页数:2
相关论文
共 12 条
[2]   Extraordinary optical transmission through sub-wavelength hole arrays [J].
Ebbesen, TW ;
Lezec, HJ ;
Ghaemi, HF ;
Thio, T ;
Wolff, PA .
NATURE, 1998, 391 (6668) :667-669
[3]  
Maxwell-Garnett J. C., 1906, PHILOS T ROY SOC LON, V205, P237, DOI DOI 10.1098/RSTA.1906.0007
[4]  
MBISE G, 1997, J PHYS D, V30, P1
[5]  
NEGEBAUER CA, 1970, HDB THIN FILM TECHNO, pCH8
[6]   Spectral switching of the preferred transmission direction in absorbing anisotropic composites [J].
Ng, MW ;
Smith, GB ;
Dligatch, S .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1995, 28 (12) :2578-2584
[7]   Transmission resonances on metallic gratings with very narrow slits [J].
Porto, JA ;
García-Vidal, FJ ;
Pendry, JB .
PHYSICAL REVIEW LETTERS, 1999, 83 (14) :2845-2848
[8]   THEORY OF ANGULAR SELECTIVE TRANSMITTANCE IN OBLIQUE COLUMNAR THIN-FILMS CONTAINING METAL AND VOIDS [J].
SMITH, GB .
APPLIED OPTICS, 1990, 29 (25) :3685-3693
[9]   Thin film angular selective glazing [J].
Smith, GB ;
Dligatch, S ;
Sullivan, R ;
Hutchins, MG .
SOLAR ENERGY, 1998, 62 (03) :229-244
[10]   NOBLE-METAL-BASED TRANSPARENT INFRARED REFLECTORS - EXPERIMENTS AND THEORETICAL ANALYSES FOR VERY THIN GOLD-FILMS [J].
SMITH, GB ;
NIKLASSON, GA ;
SVENSSON, JSEM ;
GRANQVIST, CG .
JOURNAL OF APPLIED PHYSICS, 1986, 59 (02) :571-581