Recent developments in 3D electromagnetic and charged particle simulation

被引:0
作者
Becker, Ulrich [1 ]
机构
[1] CST GmbH, D-64289 Darmstadt, Germany
来源
EIGHTH IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE | 2007年
关键词
EM simulation; PIC; gun code; wakefield; thermal simulation; FIT;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Modern electronic devices such as microwave tubes, accelerators, displays or high voltage devices have grown considerably in complexity, making a careful analysis and understanding of the devices' behaviour increasingly important. CST offers user-firiendly numerical simulation tools for the accurate analysis of electromagnetic fields in combination with charged particles, including basic thermal analysis. The CST STUDIO SUITE (TM) code family is the direct successor of the code MAFIA, combining the numerical accuracy of the Finite Integration Technique and Perfect Boundary Approximation (PBA)(R) within an intuitive, easy-to-use CAD environment. Automatic parameter sweeping and optimization are available to achieve and control design goals. In this paper recent developments in the solver modules will be presented and demonstrated by way of various application examples.
引用
收藏
页码:9 / 11
页数:3
相关论文
共 6 条
  • [1] *CST STUD SUIT, CST STUD SUIT 2006B
  • [2] HAMME F, 2006, P ICAP C CHAM CH
  • [3] KRIETENSTEIN B, 1998, P 19 INT LIN ACC C L, P860
  • [4] WEILAND T, 1977, AEU-INT J ELECTRON C, V31, P116
  • [5] Weiland T, 1996, INT J NUMER MODEL EL, V9, P295, DOI 10.1002/(SICI)1099-1204(199607)9:4<295::AID-JNM240>3.0.CO
  • [6] 2-8