Control of geometrical sources of error in residual stress analysis by energy-dispersive X-ray diffraction

被引：0
|
作者：
Alfonso, JA
Greaves, ED
Lavelle, B
Sajo-Bohus, L
机构：
[1] Inst Venezolano Invest Cient, Ctr Quim, Lab Rayos X, Caracas 1020A, Venezuela
[2] Univ Simon Bolivar, Dept Fis, Caracas 1080A, Venezuela
[3] CNRS, CEMES, Toulouse, France
来源：
JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN | 2003年 / 38卷 / 04期
关键词：
energy-dispersive X-ray diffraction; residual stress; misalignment parameters;
D O I：
10.1243/03093240360692878
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
A theoretical expression that describes the influence of instrumental errors in the determination of residual stress by energy-dispersive X-ray diffraction (EDXRD) is derived. The calculation predicts the shift in the diffraction peak energy with variation in the angle Psi as a function of the misalignment parameters. A simple model that allows evaluation and monitoring of instrumental adjustment for residual stress measurements by EDXRD is shown. Good agreement between experimental and theoretical data is obtained using the model developed.
引用
收藏
页码：283 / 288
页数：6
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