Electron field emission from sp 2-induced insulating to metallic behaviour of amorphous carbon (a-C) films

被引：3
|
作者：
Mahanandia, Pitamber [1 ]
Viswakarma, P. N. [1 ]
Bhotla, Prasad Vishnu [1 ]
Subramanyam, S. V. [1 ]
Nanda, Karuna Kar [2 ]
机构：
[1] Indian Inst Sci, Dept Phys, Bangalore 560012, Karnataka, India
[2] Indian Inst Sci, Mat Res Ctr, Bangalore 560012, Karnataka, India
来源：
BULLETIN OF MATERIALS SCIENCE | 2010年 / 33卷 / 03期
关键词：
Amorphous carbon; transport; field emission; DIAMOND-LIKE CARBON; THIN-FILMS; SURFACE-TREATMENT; RAMAN-SPECTRA; DEPOSITION; THRESHOLD; NANOTUBES; ARC;
D O I：
10.1007/s12034-010-0033-9
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The influence of concentration and size of sp (2) cluster on the transport properties and electron field emissions of amorphous carbon films have been investigated. The observed insulating to metallic behaviour from reduced activation energy derived from transport measurement and threshold field for electron emission of a-C films can be explained in terms of improvements in the connectivity between sp (2) clusters. The connectivity is resulted by the cluster concentration and size. The concentration and size of sp (2) content cluster is regulated by the coalescence of carbon globules into clusters, which evolves with deposition conditions.
引用
收藏
页码：215 / 220
页数：6
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