Optical, structural and optoelectronic properties of pulsed laser deposition PbS thin film

被引：19

作者：

Atwa, D. M. M. ^{[1
]}

Azzouz, I. M. ^{[1
]}

Badr, Y. ^{[1
]}

机构：

[1] Cairo Univ, Natl Inst Laser Enhanced Sci, Giza 12613, Egypt

来源：

APPLIED PHYSICS B-LASERS AND OPTICS | 2011年 / 103卷 / 01期

关键词：

SILAR TECHNIQUE; ELECTRODEPOSITION; NANOPARTICLES; SURFACE; GROWTH;

D O I：

10.1007/s00340-010-4311-4

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Lead sulfide (PbS) nano-structured film has been grown on quartz substrates by the PLD technique. The deposited films were characterized by X-ray diffraction (XRD), selected area electron diffraction (SAED), transmission electron microscopy (TEM) and scanning electron microscopy (SEM). Formation of cubic phase of PbS nanocrystals is proven. The absorption and emission spectra were measured for different thicknesses of the films. I-V characteristics and photoconductivity of the deposited film were also measured. The results indicate an efficient performance of the deposited films as an optical detector.

引用

页码：161 / 164

页数：4

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