Scalable cell technology utilizing domain wall motion for high-speed MRAM

被引:28
作者
Numata, H. [1 ]
Suzuki, T. [1 ]
Ohshima, N. [1 ]
Fukami, S. [1 ]
Nagahara, K. [1 ]
Ishiwata, N. [1 ]
Kasai, N. [1 ]
机构
[1] NEC Corp Ltd, Syst Device Res Labs, 1120 Shimokuzawa, Sagamihara, Kanagawa 2291198, Japan
来源
2007 SYMPOSIUM ON VLSI TECHNOLOGY, DIGEST OF TECHNICAL PAPERS | 2007年
关键词
D O I
10.1109/VLSIT.2007.4339705
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We propose a new MRAM cell that stores data in the form of the domain wall (DW) position. The DW is moved by the spin-polarized current that flows in the free layer. The cell was fabricated and the writing characteristics were investigated. A writing current of the cell was scalable, and the current density was reduced by using a new material. The cell is suitable for a high-speed MRAM that will compete with an eSRAM.
引用
收藏
页码:232 / +
页数:2
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