Light scattering properties of surface-textured substrates

被引：32

作者：

Jager, Klaus ^{[1
]}

Isabella, Olindo ^{[1
]}

Zhao, Lu ^{[1
]}

Zeman, Miro ^{[1
]}

机构：

[1] Delft Univ Technol, DIMES, Elect Energy Convers Unit, NL-2628 GB Delft, Netherlands

来源：

PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7 NO 3-4 | 2010年 / 7卷 / 3-4期

关键词：

SILICON SOLAR-CELLS;

D O I：

10.1002/pssc.200982695

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Light trapping in state-of-the-art thin-film silicon solar cells is accomplished by scattering of light at rough interfaces. Further enhancement of light absorption in the absorber layers can be achieved by optimizing the scattering via designing the morphology of these interfaces. The haze parameter and the angular intensity distribution of the scattered light were measured. The angular intensity measurements were carried out with variable angle spectrometry, allowing wavelengths in the visible and near infrared range. The measurements revealed new insights regarding the strong effects of the substrate surface roughness and morphology on the wavelength dependent variations of the angular intensity distribution. (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

引用

页码：945 / 948

页数：4

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