Quantification of Thin-film Coating Thickness of Pharmaceutical Tablets using Wavelet Analysis of Terahertz Pulsed Imaging Data

被引：0

作者：

Zhong, Shuncong ^{[1
]}

Shen, Yao-Chun ^{[1
]}

Evans, Mike ^{[2
]}

Zeitler, J. Axel ^{[3
]}

May, Robert K. ^{[3
]}

Gladden, Lynn F. ^{[3
]}

Byers, Chris ^{[4
]}

机构：

[1] Univ Liverpool, Dept Elect Engn & Elect, Liverpool L69 3GJ, Merseyside, England

[2] TeraView Ltd, Cambridge CB4 0WS, England

[3] Univ Cambridge, Dept Chemical Engn & Biotechnol, Cambridge CB2 3RA, England

[4] Oystar Manesty, Knowsley L34 9JS, England

来源：

2009 34TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES, VOLS 1 AND 2 | 2009年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Terahertz pulsed imaging (TPI) is a powerful tool for nondestructive and quantitative characterization of pharmaceutical tablet coatings. In this paper, we present various processing methods for determining coating thickness from the measured terahertz waveform. We demonstrate that a wavelet-based method can be used to characterize the tablet coating with a thickness down to 25 microns, which is better than a conventional "peak-finding" method. Experimental results demonstrated that this new method is also applicable to real-time in-situ monitoring and control of pharmaceutical manufacture processes.

引用

页码：47 / +

页数：2

共 9 条

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