ReNEW: Enhancing Lifetime for ReRAM Crossbar based Neural Network Accelerators

被引:24
作者
Wen, Wen [1 ]
Zhang, Youtao [2 ]
Yang, Jun [1 ]
机构
[1] Univ Pittsburgh, Dept Elect & Comp Engn, Pittsburgh, PA 15260 USA
[2] Univ Pittsburgh, Dept Comp Sci, Pittsburgh, PA 15260 USA
来源
2019 IEEE 37TH INTERNATIONAL CONFERENCE ON COMPUTER DESIGN (ICCD 2019) | 2019年
基金
美国国家科学基金会;
关键词
RESISTIVE MEMORY; MODEL; DEVICE; 1T1R;
D O I
10.1109/ICCD46524.2019.00074
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
With analog current accumulation feature, resistive memory (ReRAM) crossbars are widely studied to accelerate neural network applications. The ReRAM crossbar based accelerators have many advantages over conventional CMOS-based accelerators, such as high performance and energy efficiency. However, due to the limited cell endurance, these accelerators suffer from short programming cycles when weights that stored in ReRAM cells are frequently updated during the neural network training phase. In this paper, by exploiting the wearing out mechanism of ReRAM cell, we propose a novel comprehensive framework, ReNEW, to enhance the lifetime of the ReRAM crossbar based accelerators, particularly for neural network training. Evaluation results show that, our proposed schemes reduce the total effective writes to ReRAM crossbar based accelerators by up to 500.3x, 50.0x, 2.83x and 1.60x over two MLC ReRAM crossbar baselines, one SLC ReRAM crossbar baseline and an SLC ReRAM crossbar design with optimal timing, respectively.
引用
收藏
页码:487 / 496
页数:10
相关论文
共 62 条
[1]  
[Anonymous], 2017, P 2017 IEEE 6 NONVOL, DOI DOI 10.1109/NVMSA.2017.8064464
[2]  
[Anonymous], 2016, P ICLR
[3]  
[Anonymous], 2017, HPCA
[4]  
[Anonymous], 2017, COMMUN ACM, DOI DOI 10.1145/3065386
[5]  
[Anonymous], 2013, 2013 IEEE INT EL DEV
[6]  
[Anonymous], 2016, ABS160606160 ARXIV
[7]  
[Anonymous], FUT EL DEV KANS IMFE
[8]  
[Anonymous], 2017 IEEE 28 ANN
[9]  
[Anonymous], 2011, IMPROVING SPEED NEUR
[10]  
[Anonymous], 2018, IEEE T CYBERN