Interface phenomena;
Self-assembled monlayers;
AFM;
Molecular junctions;
Nanoelectronics;
Charge transport;
MOLECULE-METAL JUNCTIONS;
SET MODEL CHEMISTRY;
ELECTRONIC JUNCTIONS;
CONTACT RESISTANCE;
TUNNEL-JUNCTIONS;
CHARGE-TRANSPORT;
FLOPPY MOLECULES;
TOTAL ENERGIES;
LENGTH;
CONDUCTANCE;
D O I:
10.1016/j.apsadv.2021.100094
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
To quantify charge transport through molecular junctions fabricated using the conducting probe atomic force microscopy (CP-AFM) platform, information on the number of molecules.. per junction is absolutely necessary... can be currently obtained only via contact mechanics, and the Young's modulus.. of the self-assembled monolayer (SAM) utilized in a key quantity for this approach. The experimental determination of.. for SAMs of CP-AFM junctions fabricated using oligophenylene dithiols (OPDn, 1 <= n <= 4) and gold electrodes turned out to be too challenging. Recent measurements (Z. Xie et al, J. Am. Chem. Soc. 139 (2017) 5696) merely succeeded to provide a low bound estimate (E approximate to 58 GPa). Supplying this missing experimental information is the aim of the present theoretical investigation. Our microscopic calculations yield values E approximate to 240 +/- 6 GPa for the OPDn SAMs of the aforementioned experimental study, which are larger than those of steel (E approximate to 180 - 200 GPa) and silicon (E approximate to 130 - 185 GPa). The fact that the presently computed.. is much larger than the aforementioned experimental lower bound explain why experimentally measuring.. of OPDn SAM's is so challenging. Having E approximate to 337 +/- 8 GPa, OPDn SAMs with herringbone arrangement adsorbed on fcc (111)Au are even stiffer than Si 3N 4 (E approximate to 160 - 290 GPa).