Control of degradation processes in electronic devices and prediction of their reliability

被引：0

作者：

Aladinskii, VK

Kasimov, AR

机构：

来源：

MEASUREMENT TECHNIQUES | 1998年 / 41卷 / 01期

关键词：

Leakage Current; Threshold Voltage; Microwave Pulse; Informative Parameter; Effective Lifetime;

D O I：

10.1007/BF02512128

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A method is proposed for controlling degradation processes and the reliability of electronic devices with the aid of a system of informative parameters. Application of gamma radiation improves the sensitivity of the method.

引用

页码：61 / 64

页数：4