共 50 条
Influence of Co loading on structural and morphological properties of Co-doped ZnO thin films grown by pulsed electron beam ablation
被引:7
|作者:
Ali, Asghar
[1
]
Pinto, Andre Luiz
[2
]
Henda, Redhouane
[1
]
Fagerberg, Ragnar
[3
]
机构:
[1] Laurentian Univ, Sch Engn, Sudbury, ON, Canada
[2] Univ Estado Minas Gerais, Ave Brasilia 1-304, Joao Monlevade, MG, Brazil
[3] SINTEF Mat & Chem, Dept Mat & Nanotechnol, Trondheim, Norway
基金:
加拿大自然科学与工程研究理事会;
加拿大创新基金会;
关键词:
Co-doped ZnO thin film;
Co loading;
Pulsed electron beam ablation;
Pre-annealing;
Structure;
Morphology;
OPTICAL-PROPERTIES;
DEPOSITION;
FERROMAGNETISM;
TEMPERATURE;
EXPANSION;
ORIGIN;
D O I:
10.1016/j.jallcom.2017.10.032
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
We report on the effect of cobalt loading in the target material on the properties of thin film nanocomposites of Co-doped zinc oxide (CZO) Zn1-xCoxO. The films have been deposited by pulsed electron beam ablation (PEBA) at 450 degrees C on pre-annealed (1100 degrees C) c-sapphire and Si (100) substrates. The experimental results, based on scanning electron and atomic force microscopies (SEM, AFM), indicate that Co doping significantly affects the morphology of the films. X-ray diffraction (XRD) measurements reveal that the films on both substrates exhibit a prominent ZnO hexagonal wurtzite structure for x = 0.05, whereas higher Co loading (x = 0.1, 0.2) results in a strong deformation of ZnO wurtzite lattice and in a higher content of hexagonal close-packed (hcp) metallic Co in CZO films. X-ray photoelectron spectroscopy (XPS) data confirm the presence of non-oxidized metallic Co (Co degrees) in the deposited films. Both XRD and XPS results indicate an increase in Co degrees content in the films as Co loading in the target is increased. (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码:181 / 188
页数:8
相关论文