Material analysis end-station of the Hyogo-ken beamline at SPring-8

被引：2

作者：

Kaneyoshi, T ^{[1
]}

Ishihara, T

Yoshioka, H

Motoyama, M

Fukushima, S

Hayashi, K

Kawai, J

Taniguchi, K

Hayakawa, S

Gohshi, Y

机构：

[1] Hyogo Prefectural Inst Ind Res, Kobe, Hyogo 654, Japan

[2] Natl Inst Res Inorgan Mat, Ibaraki, Osaka 305, Japan

[3] Kyoto Univ, Dept Mat Sci & Engn, Kyoto 60601, Japan

[4] Osaka Electrocommun Univ, Dept Solid State Elect, Osaka 572, Japan

[5] Univ Tokyo, Grad Sch Engn, Dept Appl Chem, Tokyo 113, Japan

来源：

JOURNAL OF SYNCHROTRON RADIATION | 1998年 / 5卷

关键词：

SPring-8; surface analysis; X-ray diffraction; X-ray fluorescence analysis; X-ray fluorescence holography; polarized X-ray emission spectroscopy;

D O I：

10.1107/S0909049598001502

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Plans to construct surface-analysis equipment which will be placed on beamline BL24XU of SPring-8 are presented. There are three experimental hutches in BL24XU, which are available simultaneously by using diamond monochromators as beam splitters. The purpose of the surface-analysis equipment is the simultaneous measurement of fluorescent and diffracted X-rays in grazing-incidence geometry. The instrument is equipped with a solid-state detector (SSD) and a hat position-sensitive proportional counter (PSPC) combined with analysing crystals for X-ray fluorescence (XRF) analysis. A curved PSPC and the goniometer that mounts the SSD used for XRF are also installed for X-ray diffraction. X-ray fluorescence holography and polarized X-ray emission spectroscopy modes are available, so three-dimensional images of atomic configurations and also the anisotropic structure of materials will be studied.

引用

页码：509 / 511

页数：3

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