Construction of independently driven double-tip scanning tunneling microscope

被引：29

作者：

Takami, K

Akai-Kasayai, M

Saito, A

Aono, M

Kuwahara, Y

机构：

[1] Osaka Univ, Dept Mat & Life Sci, Suita, Osaka 5650871, Japan

[2] JST, ICORP, Nanoscale Quantum Conductor Array Project, Kawaguchi, Saitama 3320012, Japan

[3] RIKEN, Harima Inst, Mikazuki, Hyogo 6795148, Japan

[4] NIMS, Nanomat Lab, Tsukuba, Ibaraki 3050003, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2005年 / 44卷 / 1-7期

关键词：

scanning tunneling microscope; independently driven double-tip scanning tunneling microscope; nanostructure; micrometer scale; poly(3-octylthiophene); resistivity; electric conduction;

D O I：

10.1143/JJAP.44.L120

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We construct an independently driven double-tip scanning tunneling microscope (STM) for evaluating electrical conduction within the micrometer scale under an ambient condition. Each independently driven STM unit has on atomic resolution and the tip approaches an intended position within 10 mm 2 on the surface with three course driving stages and a piezoelectric device which has a maximum scan area of 10 pm. The current flow between the two tips through the material can be detected in the range from 0.1 pA to 100 nA. The measurement of the resistivity of regiorandom poly(3-octylthiophene) thin films was demonstrated using this system.

引用

页码：L120 / L122

页数：3

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