Atomic layer deposition on polymer based flexible packaging materials: Growth characteristics and diffusion barrier properties

被引:59
作者
Kaariainen, Tommi O. [1 ]
Maydannik, Philipp [1 ]
Cameron, David C. [1 ]
Lahtinen, Kimmo [2 ]
Johansson, Petri [2 ]
Kuusipalo, Jurkka [2 ]
机构
[1] Lappeenranta Univ Technol, ASTRaL, FI-50100 Mikkeli, Finland
[2] Tampere Univ Technol, FIN-33101 Tampere, Finland
关键词
Atomic layer deposition; Thin films; Polymer extrusion; Flexible packaging materials; Atomic force microscopy; Attenuated Total Reflection Fourier-Transformed Infrared Spectroscopy (ATR-FTIR); Gas diffusion barriers; AL2O3; TEMPERATURE; FILMS; COATINGS; OXIDE;
D O I
10.1016/j.tsf.2010.12.171
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
One of the most promising areas for the industrial application of atomic layer deposition (ALD) is for gas barrier layers on polymers. In this work, a packaging material system with improved diffusion barrier properties has been developed and studied by applying ALD on flexible polymer based packaging materials. Nanometer scale metal oxide films have been applied to polymer-coated papers and their diffusion barrier properties have been studied by means of water vapor and oxygen transmission rates. The materials for the study were constructed in two stages: the paper was firstly extrusion coated with polymer film, which was then followed by the ALD deposition of oxide layer. The polymers used as extrusion coatings were polypropylene, low and high density polyethylene, polylactide and polyethylene terephthalate. Water vapor transmission rates (WVTRs) were measured according to method SCAN-P 22:68 and oxygen transmission rates (O(2)TRs) according to a standard ASTM D 3985. According to the results a 10 nm oxide layer already decreased the oxygen transmission by a factor of 10 compared to uncoated material. WVTR with 40 nm ALD layer was better than the level currently required for most common dry flexible packaging applications. When the oxide layer thickness was increased to 100 nm and above, the measured WVTRs were limited by the measurement set up. Using an ALD layer allowed the polymer thickness on flexible packaging materials to be reduced. Once the ALD layer was 40 nm thick, WVTRs and O(2)TRs were no longer dependent on polymer layer thickness. Thus, nanometer scale ALD oxide layers have shown their feasibility as high quality diffusion barriers on flexible packaging materials. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:3146 / 3154
页数:9
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