Effects of gamma irradiation on DEPFET pixel sensors for the Belle II experiment

被引：5

作者：

Schreeck, Harrison ^{[1
]}

Paschen, Botho ^{[2
]}

Wieduwilt, Philipp ^{[1
]}

Ahlburg, Patrick ^{[2
]}

Andricek, Ladislav ^{[4
]}

Dingfelder, Jochen ^{[2
]}

Frey, Ariane ^{[1
]}

Luetticke, Florian ^{[2
]}

Marinas, Carlos ^{[3
]}

Richter, Rainer ^{[4
]}

Schwenker, Benjamin ^{[1
]}

机构：

[1] Georg August Univ Gottingen, Phys Inst 2, Friedrich Hund Pl 1, D-37077 Gottingen, Germany

[2] Univ Bonn, Phys Inst, Nussallee 12, D-53115 Bonn, Germany

[3] Univ Valencia, Inst Fis Corpuscular IFIC, CSIC, Catedrat Jose Beltran 2, E-46980 Paterna, Valencia, Spain

[4] Max Planck Gesell HLL, Halbleiterlab, Otto Hahn Ring 6, D-81739 Munich, Germany

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2020年 / 959卷

关键词：

DEPFET; Radiation damage; Particle tracking detectors; Belle II; DETECTOR; SYSTEM;

D O I：

10.1016/j.nima.2020.163522

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

For the Belle II experiment at KEK (Tsukuba, Japan) the KEKB accelerator was upgraded to deliver a 40 times larger instantaneous luminosity than before, which requires an increased radiation hardness of the detector components. As the innermost part of the Belle II detector, the pixel detector (PXD), based on DEPFET (DEpleted P-channel Field Effect Transistor) technology, is most exposed to radiation from the accelerator. An irradiation campaign was performed to verify that the PXD can cope with the expected amount of radiation. We present the results of this measurement campaign in which an X-ray machine was used to irradiate a single PXD half-ladder to a total dose of 266 kGy. The half-ladder is from the same batch as the half-ladders used for Belle II. According to simulations, the total accumulated dose corresponds to 7-10 years of Belle II operation. While individual components have been irradiated before, this campaign is the first full system irradiation. We discuss the effects on the DEPFET sensors, as well as the performance of the front-end electronics. In addition, we present efficiency studies of the half-ladder from beam tests performed before and after the irradiation.

引用

页数：9

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