The design of general integrated circuit on-line testing instrument

被引：0

作者：

Wang, ZY ^{[1
]}

Hu, WH ^{[1
]}

Ji, FR ^{[1
]}

机构：

[1] Ordance Engn Coll, Shijiazhuang 050003, Peoples R China

来源：

ISTM/2003: 5TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-6, CONFERENCE PROCEEDINGS | 2003年

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The on-line testing technique is used widely in both performance measuring and fault diagnosis, especially in large-scale integrated circuit. The general integrated circuit on-line testing instrument based on VXI bus computer can complete the fault diagnosis to many integrated circuits which are in the circuit board with the help of several virtual-instrument cards. This paper provides the work theory, hardware composed and software design of testing instrument.

引用

页码：3453 / 3455

页数：3