Effects of reflow atmosphere and flux on Sn whisker growth of Sn-Ag-Cu solders

We evaluated the Sn whisker growth behavior of Sn-Ag-Cu solder fillets on lead frames of quad flat packages (QFPs) upon OSP printed circuit boards that were exposed to 85 A degrees C/85% relative humidity (RH) exposure. Three different concentrations of halogen flux for activated Sn-3.0wt%Ag-0.5wt%Cu were used to solder in air and in an inert N(2) reflow atmosphere. The lead frames of the QFPs consisted of Sn plated Cu and Fe-42wt%Ni (alloy 42). Sn whiskers were observed on the surface of the QFP solder fillet joints that were reflowed with halogen containing flux in an air atmosphere. A substantial amount of Sn oxides were formed in those solder fillets while whisker growth and the amount of Sn oxides increased with the halogen content. Sn oxide formation apparently enhanced whisker formation. The combination of air reflow atmosphere and high halogen flux was the worst combination for solder fillet oxidation resulting in Sn whisker formation regardless of the electrode's lead frame composition of Cu or alloy 42. In contrast, an inert N(2) reflow atmosphere obviously prevented Sn whisker formation on Sn-Ag-Cu solder fillets under all conditions used in this work.