Effect of manganese stress on the mineral content of the leaves of wheat seedlings by use of X-ray fluorescence excited by synchrotron radiation

The present study describes the potential of the synchrotron radiation based X-ray fluorescence spectroscopy technique for the rapid, sensitive, user friendly and simultaneous monitoring of the changes in the elemental profile of the wheat seedlings stressed by excess manganese (Mn). For this, X-ray fluorescence spectra of the leaves of the control and Mn treated wheat seedlings have been recorded by synchrotron radiation X-ray of energy 15keV. The analyses of the recorded spectra show the presence of elements chlorine, potassium, calcium, manganese, iron, copper, nickel, and zinc. A calibration-free approach, PyMca has been used for the quantitative estimation of the detected elements in the leaves of the control and Mn treated wheat seedlings. The excess supply of Mn to wheat seedlings results in the accumulation of manganese in the leaves of the seedlings. The accumulation of manganese in wheat seedlings negatively affects the uptake and translocation of calcium, potassium, and iron while it has stimulating effect on the uptake of copper and zinc.