Short-range image-based method for the inspection of strong scatterers using microwaves

被引:28
|
作者
Bozza, Giovanni [1 ]
Estatico, Claudio
Massa, Andrea
Pastorino, Matteo
Randazzo, Andrea
机构
[1] Univ Genoa, Dept Biophys & Elect Engn, I-16145 Genoa, Italy
[2] Univ Genoa, Dept Math, I-16146 Genoa, Italy
[3] Univ Trent, Dept Informat & Commun Technol, I-38050 Trento, Italy
关键词
imaging systems; inverse problems; inverse scattering; microwave imaging; Newton methods;
D O I
10.1109/TIM.2007.900127
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, a new inverse-scattering-based reconstruction method is presented. The aim of the approach is to "invert" wavefield samples, which are collected by experimental tomographic systems working at radio frequencies and microwaves. Imaging systems operating in this band require the solution of a nonlinear and highly ill-posed inverse problem. The need to regularize the inverse problem is addressed here by considering an efficient Inexact Newton method that is able to inspect strong scatterers. In this paper, the mathematical formulation of the approach is detailed and discussed. Moreover, the results of several numerical simulations concerning the reconstructions of dielectric structures in noisy environments and in several applicative scenarios are reported.
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页码:1181 / 1188
页数:8
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