Substrate temperature dependence of Si growth by an electron beam irradiation technique using a Si2H6 gas source

被引:1
作者
Hirose, F [1 ]
Sakamoto, H [1 ]
机构
[1] Mitsubishi Heavy Ind, Adv Technol Res Ctr, Kanazawa Ku, Yokohama, Kanagawa 236, Japan
关键词
electron beam; growth; Si; Si2H6; precursor; stimulation;
D O I
10.1016/S0169-4332(98)00304-3
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The kinetics of low-temperature Si growth using the electron beam irradiation technique has been studied, Si films can be grown exclusively under the electron beam irradiated area on Si substrates in a Si2H6 atmosphere. However, Si growth is strongly dependent on the substrate temperature, which reveals that growth is limited by surface reactions. Higher Si hydrides such as SiH2, SiH3 and Si2H6 are considered precursors of Si growth. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:293 / 296
页数:4
相关论文
共 10 条
[1]   TOTAL AND PARTIAL ELECTRON COLLISIONAL IONIZATION CROSS-SECTIONS FOR CH4, C2H6, SIH4, AND SI2H6 [J].
CHATHAM, H ;
HILS, D ;
ROBERTSON, R ;
GALLAGHER, A .
JOURNAL OF CHEMICAL PHYSICS, 1984, 81 (04) :1770-1777
[2]   ADSORPTION-KINETICS OF SIH4, SI2H6 AND SI3H8 ON THE SI(111)-(7X7) SURFACE [J].
GATES, SM .
SURFACE SCIENCE, 1988, 195 (1-2) :307-329
[3]   ELECTRON-STIMULATED DESORPTION OF SURFACE HYDROGEN ON A SI(100) SURFACE [J].
HIROSE, F ;
SAKAMOTO, H .
APPLIED SURFACE SCIENCE, 1994, 75 (1-4) :87-92
[4]   Modeling growth in Si gas-source molecular beam epitaxy using Si2H6 [J].
Hirose, F .
JOURNAL OF CRYSTAL GROWTH, 1997, 179 (1-2) :108-114
[5]   Low-temperature Si selective epitaxial growth using electron-beam-induced reaction [J].
Hirose, F ;
Sakamoto, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (11) :5904-5907
[6]   Adsorption mechanisms of Si2H6 and GeH4 on Si(100)2x1 surfaces [J].
Hirose, F ;
Sakamoto, H .
APPLIED SURFACE SCIENCE, 1996, 107 :75-80
[7]  
HIROSE F, UNPUB
[8]  
IMBIHL R, 1989, PHYS REV B, V39, P522
[9]   ELECTRON-BEAM INDUCED SELECTIVE ETCHING AND DEPOSITION TECHNOLOGY [J].
MATSUI, S ;
ICHIHASHI, T ;
MITO, M .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1989, 7 (05) :1182-1190
[10]   DETERMINATION OF THE ABSOLUTE CROSS-SECTION OF ELECTRON-STIMULATED-DESORPTION OF DEUTERIUM FROM SI(111) [J].
MATSUNAMI, N ;
HASEBE, Y ;
ITOH, N .
SURFACE SCIENCE, 1987, 192 (01) :27-35