LNA Noise Parameter Measurement

被引:0
|
作者
Lehmeyer, Bernhard [1 ]
Ivrlac, Michel T. [1 ]
Nossek, Josef A. [1 ]
机构
[1] Tech Univ Munich, Inst Circuit Theory & Signal Proc, D-80290 Munich, Germany
来源
2015 EUROPEAN CONFERENCE ON CIRCUIT THEORY AND DESIGN (ECCTD) | 2015年
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Joint measurement of stochastic parameters of a low noise amplifier (LNA), based on output power measurement for input termination impedances is considered. As an advantage of this method the noise parameters can be determined in a quick way for narrow and broad band applications without special equipment. Knowing the noise parameters helps the user designing both matching networks fir given low noise amplifiers and fir optimizing amplifiers. Four real parameters characterize the amplifier with the noise figure as function of the matching network. About ten different values for input termination impedances also provide an estimation of sensitivity and accuracy of this new method.
引用
收藏
页码:45 / 48
页数:4
相关论文
共 50 条
  • [21] PARAMETER-IDENTIFICATION OF DISTRIBUTED PARAMETER-SYSTEMS IN THE PRESENCE OF MEASUREMENT NOISE
    SAGARA, S
    YANG, ZJ
    WADA, K
    INTERNATIONAL JOURNAL OF SYSTEMS SCIENCE, 1991, 22 (08) : 1391 - 1401
  • [22] Evaluation on Uncertainty of Noise Parameter Against Commercial Measurement
    Wu Aihua
    Liang Faguo
    Han Lihua
    Liu Chen
    Zhai Yuwei
    Zheng Yanqiu
    PROCEEDINGS OF 2013 IEEE 11TH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS (ICEMI), 2013, : 441 - 445
  • [23] Amplifier noise-parameter measurement checks and verification
    Randa, J
    Walker, DK
    ARFTG: AUTOMATIC RF TECHNIQUES GROUP, CONFERENCE DIGEST, SPRING 2004: ON WAFER CHARACTERIZATION, 2004, : 41 - 45
  • [24] Wide temperature range SiGe HBT noise parameter modeling and LNA design for extreme environment Electronics
    Niu, Guofu
    Ma, Rongchen
    Luo, Lan
    Cressler, John D.
    INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS, 2015, 28 (06) : 675 - 683
  • [25] Novel LNA Cuts Noise, Not Gain
    Wang, Chunhua
    Tu, Yuxiang
    MICROWAVES & RF, 2012, 51 (06) : 60 - +
  • [26] Cryogenic Self-Calibrating Noise Parameter Measurement System
    Russell, Damon
    Weinreb, Sander
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2012, 60 (05) : 1456 - 1467
  • [27] Millimeter-wave automated noise parameter measurement systems
    Microwave Journal, 2007, 50 (08): : 114 - 118
  • [28] Measurement Noise Distribution as a Metric for Parameter Estimation in Dynamical Systems
    Lillacci, Gabriele
    Khammash, Mustafa
    2012 IEEE 51ST ANNUAL CONFERENCE ON DECISION AND CONTROL (CDC), 2012, : 1494 - 1499
  • [29] A New Approach for Estimating the Robustness of Parameter Estimates to Measurement Noise
    Raman, Dhruva V.
    Anderson, James
    Papachristodoulou, Antonis
    2016 AMERICAN CONTROL CONFERENCE (ACC), 2016, : 1820 - 1825
  • [30] Parameter Identification using PSO under measurement noise conditions
    Cortez-Vega, R.
    Maldonado, J.
    Garrido, R.
    2019 6TH INTERNATIONAL CONFERENCE ON CONTROL, DECISION AND INFORMATION TECHNOLOGIES (CODIT 2019), 2019, : 103 - 108