Data preparation and evaluation techniques for x-ray diffraction microscopy

被引：27

作者：

Steinbrener, Jan ^{[1
]}

Nelson, Johanna ^{[1
]}

Huang, Xiaojing ^{[1
]}

Marchesini, Stefano ^{[2
]}

Shapiro, David ^{[2
]}

Turner, Joshua J. ^{[1
]}

Jacobsen, Chris ^{[1
,3
,4
]}

机构：

[1] SUNY Stony Brook, Dept Phys & Astron, Stony Brook, NY 11794 USA

[2] Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA

[3] Northwestern Univ, Dept Phys & Astron, Evanston, IL 60208 USA

[4] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

来源：

OPTICS EXPRESS | 2010年 / 18卷 / 18期

关键词：

PHASE RETRIEVAL; TRANSMISSION; RECONSTRUCTION; SCATTERING;

D O I：

10.1364/OE.18.018598

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The post-experiment processing of X-ray Diffraction Microscopy data is often time-consuming and difficult. This is mostly due to the fact that even if a preliminary result has been reconstructed, there is no definitive answer as to whether or not a better result with more consistently retrieved phases can still be obtained. We show here that the first step in data analysis, the assembly of two-dimensional diffraction patterns from a large set of raw diffraction data, is crucial to obtaining reconstructions of highest possible consistency. We have developed software that automates this process and results in consistently accurate diffraction patterns. We have furthermore derived some criteria of validity for a tool commonly used to assess the consistency of reconstructions, the phase retrieval transfer function, and suggest a modified version that has improved utility for judging reconstruction quality. (C) 2010 Optical Society of America

引用

页码：18598 / 18614

页数：17

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