Life-Cycle Assessment of NAND Flash Memory

被引：17

作者：

Boyd, Sarah ^{[1
]}

Horvath, Arpad ^{[2
]}

Dornfeld, David ^{[1
]}

机构：

[1] Univ Calif Berkeley, Dept Mech Engn, Berkeley, CA 94720 USA

[2] Univ Calif Berkeley, Dept Civil & Environm Engn, Berkeley, CA 94720 USA

来源：

IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING | 2011年 / 24卷 / 01期

关键词：

Energy conservation; environmental factors; erasable programmable read-only memory (EPROM); production management; ENERGY;

D O I：

10.1109/TSM.2010.2087395

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Solid state drives (SSDs) show potential for environmental benefits over magnetic data storage due to their lower power consumption. To investigate this possibility, a life-cycle assessment (LCA) of NAND flash over five technology generations (150 nm, 120 nm, 90 nm, 65 nm, and 45 nm) is presented to quantify environmental impacts occurring in flash production and to view their trends over time. The inventory of resources and emissions in flash manufacturing, electricity generation, and some chemicals are based on process data, while that of fab infrastructure, water and the remaining chemicals are determined using economic input-output life-cycle assessment (EIO-LCA) or hybrid LCA. Over the past decade, impacts have fallen in all impact categories per gigabyte. Sensitivity analysis shows that the most influential factors over the life-cycle global warming potential (GWP) of flash memory are abatement of perfluorinated compounds and reduction of electricity-related emissions in manufacturing. A limited comparison between the life-cycle energy use and GWP of a 100GB laptop SSD and hard disk drive shows higher impacts for SSD in many use phase scenarios. This comparison is not indicative for all impact categories, however, and is not conclusive due to differences in boundary and functional unit.

引用

页码：117 / 124

页数：8

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