A low energy ion beam line for highly charged ions

被引:3
作者
Zschornack, G
Landgraf, S
Grossmann, F
Kentsch, U
Ovsyannikov, VP
Schmidt, M
Ullmann, F
机构
[1] Tech Univ Dresden, Inst Angew Phys, D-01062 Dresden, Germany
[2] LEYBOLD Vakuum Dresden GmbH, D-01109 Dresden, Germany
关键词
EBIT; ion source; ion trap; highly charged ions; ion beam line; ion-surface interaction; multiply charged ions; low energy ions;
D O I
10.1016/j.vacuum.2005.01.044
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An ion beam line is presented, which is designed to study the interaction of highly charged ions with matter, especially solid surfaces. The highly charged ions are produced in a room temperature electron beam ion trap, the Dresden EBIT [1,2]. This device delivers bare nuclei up to elements with an atomic number of about 28, and neon-like ions up to about Z = 80. After leaving the trap the ion beam containing several neighbouring ion charge states passes through standard ion optics elements before entering an analysing magnet for separating a certain ion charge state. In a following deceleration unit, which will be integrated soon, the ions can be slowed down to a definite kinetic energy of a few eV. The characteristic of the HCI beam is presented, combined with ion extraction spectra of selected elements detected by a Faraday cup after passing through an analysing magnet. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:319 / 323
页数:5
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