Zernike apodized photon sieves for high-resolution phase-contrast x-ray microscopy

被引：30
作者：
Cheng, Guanxiao [1 ,2 ]
Hu, Chao [1 ,2 ]
Xu, Ping [3 ]
Xing, Tingwen [4 ]
机构：
[1] Chinese Acad Sci, Shenzhen Inst Adv Technol, Shenzhen 518055, Peoples R China
[2] Chinese Univ Hong Kong, Hong Kong, Hong Kong, Peoples R China
[3] Shenzhen Univ, Coll Elect Sci & Technol, Shenzhen 518060, Peoples R China
[4] Chinese Acad Sci, Inst Opt & Elect, Chengdu 610209, Peoples R China
来源：
OPTICS LETTERS | 2010年 / 35卷 / 21期
关键词：
ZONE PLATES; MODEL;
D O I：
10.1364/OL.35.003610
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We present a type of diffractive lens, Zernike apodized photon sieves ( ZAPS), used as the objective for high spatial resolution and high phase-contrast imaging of weakly absorbing materials in x rays. The structure of ZAPS is based on the combination of two concepts: apodized photon sieves and Zernike phase contrast. The ZAPS is a single optic that integrates the appropriate +/-pi/2 rad phase shift through selective zone placement shifts in an apodized photon sieve. Analysis of the focusing properties of the apodized photon sieve in terms of point-spread function show that the sidelobes have been significantly suppressed at the expense of slightly widening the width of the main lobe. In combination with synchrotron light sources, ZAPS offers new opportunities for high-resolution phase-contrast x-ray microscopy in the physical and life sciences. (C) 2010 Optical Society of America
引用
收藏
页码：3610 / 3612
页数：3
相关论文
共 13 条
  • [1] Large optical photon sieve
    Andersen, G
    [J]. OPTICS LETTERS, 2005, 30 (22) : 2976 - 2978
  • [2] Nonparaxial model for the focusing of high-numerical-aperture photon sieves
    Cao, Q
    Jahns, J
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2003, 20 (06): : 1005 - 1012
  • [3] Focusing analysis of the pinhole photon sieve: individual far-field model
    Cao, Q
    Jahns, J
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2002, 19 (12) : 2387 - 2393
  • [4] Single-element objective lens for soft x-ray differential interference contrast microscopy
    Chang, C
    Sakdinawat, A
    Fischer, P
    Anderson, E
    Attwood, D
    [J]. OPTICS LETTERS, 2006, 31 (10) : 1564 - 1566
  • [5] Soft X-ray microscopy at a spatial resolution better than 15nm
    Chao, WL
    Harteneck, BD
    Liddle, JA
    Anderson, EH
    Attwood, DT
    [J]. NATURE, 2005, 435 (7046) : 1210 - 1213
  • [6] Resolution enhancement of photon sieve based on apodization
    Cheng, Guanxiao
    Xing, Tingwen
    Liao, Zhijie
    Yang, Yong
    Ma, Jianling
    [J]. HOLOGRAPHY AND DIFFRACTIVE OPTICS III, 2008, 6832
  • [7] PHASE-CONTRAST IMAGING OF WEAKLY ABSORBING MATERIALS USING HARD X-RAYS
    DAVIS, TJ
    GAO, D
    GUREYEV, TE
    STEVENSON, AW
    WILKINS, SW
    [J]. NATURE, 1995, 373 (6515) : 595 - 598
  • [8] Diffractive optical elements for differential interference contrast x-ray microscopy
    Di Fabrizio, E
    Cojoc, D
    Cabrini, S
    Kaulich, B
    Susini, J
    Facci, P
    Wilhein, T
    [J]. OPTICS EXPRESS, 2003, 11 (19): : 2278 - 2288
  • [9] Soft X-ray microscopy of nanomagnetism
    Fischer, Peter
    Kim, Dong-Hyun
    Chao, Weilun
    Liddle, J. Alexander
    Anderson, Erik H.
    Attwood, David T.
    [J]. MATERIALS TODAY, 2006, 9 (1-2) : 26 - 33
  • [10] Sharper images by focusing soft X-rays with photon sieves
    Kipp, L
    Skibowski, M
    Johnson, RL
    Berndt, R
    Adelung, R
    Harm, S
    Seemann, R
    [J]. NATURE, 2001, 414 (6860) : 184 - 188
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