Microgeometry Capture using an Elastomeric Sensor

被引:118
作者
Johnson, Micah K. [1 ]
Cole, Forrester [1 ]
Raj, Alvin [1 ]
Adelson, Edward H. [1 ]
机构
[1] MIT, Cambridge, MA 02139 USA
来源
ACM TRANSACTIONS ON GRAPHICS | 2011年 / 30卷 / 04期
基金
美国国家科学基金会;
关键词
geometry; texture; material; microstructure; PHOTOMETRIC STEREO; TEXTURE; BRDF;
D O I
10.1145/1964921.1964941
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
We describe a system for capturing microscopic surface geometry. The system extends the retrographic sensor [Johnson and Adelson 2009] to the microscopic domain, demonstrating spatial resolution as small as 2 microns. In contrast to existing microgeometry capture techniques, the system is not affected by the optical characteristics of the surface being measured-it captures the same geometry whether the object is matte, glossy, or transparent. In addition, the hardware design allows for a variety of form factors, including a hand-held device that can be used to capture high-resolution surface geometry in the field. We achieve these results with a combination of improved sensor materials, illumination design, and reconstruction algorithm, as compared to the original sensor of Johnson and Adelson [2009].
引用
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页数:8
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