Direct measurement of quantum phases in graphene via photoemission spectroscopy

被引:71
作者
Hwang, Choongyu [1 ]
Park, Cheol-Hwan [2 ]
Siegel, David A. [1 ,2 ]
Fedorov, Alexei V. [3 ]
Louie, Steven G. [1 ,2 ]
Lanzara, Alessandra [1 ,2 ]
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA
[3] Univ Calif Berkeley, Adv Light Source, Berkeley, CA 94720 USA
关键词
BERRY TOPOLOGICAL PHASE; RESOLVED PHOTOEMISSION; BAND-STRUCTURE; GRAPHITE; SYMMETRY; NEUTRON;
D O I
10.1103/PhysRevB.84.125422
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Quantum phases provide us with important information for understanding the fundamental properties of a system. However, the observation of quantum phases, such as Berry's phase and the sign of the matrix element of the Hamiltonian between two nonequivalent localized orbitals in a tight-binding formalism, has been challenged by the presence of other factors, e. g., dynamic phases and spin or valley degeneracy, and the absence of methodology. Here, we report a way to directly access these quantum phases, through polarization-dependent angle-resolved photoemission spectroscopy (ARPES), using graphene as a prototypical two-dimensional material. We show that the momentum-and polarization-dependent spectral intensity provides direct measurements of (i) the phase of the band wavefunction and (ii) the sign of matrix elements for nonequivalent orbitals. Upon rotating light polarization by pi/2, we found that graphene with a Berry's phase of n pi (n = 1 for single-and n = 2 for double-layer graphene for Bloch wavefunction in the commonly used form) exhibits the rotation of ARPES intensity by pi/n, and that ARPES signals reveal the signs of the matrix elements in both single- and double-layer graphene. The method provides a technique to directly extract fundamental quantum electronic information on a variety of materials.
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页数:10
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