Modeling and characterization of noise in 90-nm RF CMOS technology

被引：0

作者：

Scholten, AJ ^{[1
]}

Tiemeijer, LF ^{[1
]}

Zegers-van Duijnhoven, ATA ^{[1
]}

Havens, RJ ^{[1
]}

de Kort, R ^{[1
]}

van Langevelde, R ^{[1
]}

Klaassen, DBM ^{[1
]}

Jeamsaksiri, W ^{[1
]}

Velghe, RMDA ^{[1
]}

机构：

[1] Philips Res Labs, NL-5656 AA Eindhoven, Netherlands

来源：

NOISE AND FLUCTUATIONS | 2005年 / 780卷

关键词：

D O I：

暂无

中图分类号：

R318 [生物医学工程];

学科分类号：

0831 ;

摘要：

引用

页码：735 / 740

页数：6

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