Preparation and characterization of electrochemically etched W tips for STM

被引：98

作者：

Ekvall, I ^{[1
]}

Wahlström, E

Claesson, D

Olin, H

Olsson, E

机构：

[1] Chalmers, SE-41296 Gothenburg, Sweden

[2] Uppsala Univ, Angstrom Lab, SE-75121 Uppsala, Sweden

来源：

MEASUREMENT SCIENCE AND TECHNOLOGY | 1999年 / 10卷 / 01期

关键词：

STM tip shape; STM tip composition; UHV; TEM; STM; scanning tunnelling microscopy;

D O I：

10.1088/0957-0233/10/1/006

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have investigated methods for cleaning de-etched polycrystalline tungsten tips for scanning tunnelling microscopy (STM). The cleaning methods include Ar-ion sputtering, heating, chemical treatments and Ne-ion self-sputtering. We correlate transmission electron microscopy images of the tip, field-emission data from the tip and images of a clean Cu(111) surface to find an optimum procedure for STM imaging. Clean and sharp tips are made by sputtering, combined with careful heating by electron bombardment. We found that optimum sputtering was obtained either by use of a 4 keV Ar-ion gun for a few seconds or by self-sputtering with Ne ions for a few seconds or until decapitation occurs.

引用

页码：11 / 18

页数：8

共 23 条

[1] NEW SCANNING TUNNELING MICROSCOPY TIP FOR MEASURING SURFACE-TOPOGRAPHY [J].

AKAMA, Y ;

NISHIMURA, E ;

SAKAI, A ;

MURAKAMI, H .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01) :429-433

[2] RELIABLE TIP PREPARATION FOR HIGH-RESOLUTION SCANNING-TUNNELING-MICROSCOPY [J].

ALBREKTSEN, O ;

SALEMINK, HWM ;

MORCH, KA ;

THOLEN, AR .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (06) :3187-3190

[3] ION MILLED TIPS FOR SCANNING TUNNELING MICROSCOPY [J].

BIEGELSEN, DK ;

PONCE, FA ;

TRAMONTANA, JC ;

KOCH, SM .

APPLIED PHYSICS LETTERS, 1987, 50 (11) :696-698

[4]

Chen C. J., 1993, INTRO SCANNING TUNNE

[5] OXIDE-FREE TIP FOR SCANNING TUNNELING MICROSCOPY [J].

COLTON, RJ ;

BAKER, SM ;

BALDESCHWIELER, JD ;

KAISER, WJ .

APPLIED PHYSICS LETTERS, 1987, 51 (05) :305-307

[6] PREPARATION AND CHARACTERIZATION OF TUNGSTEN TIPS FOR SCANNING-TUNNELING-MICROSCOPY [J].

CRICENTI, A ;

PAPARAZZO, E ;

SCARSELLI, MA ;

MORETTO, L ;

SELCI, S .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (05) :1558-1560

[7] STABLE NECKS ON METAL TIPS [J].

DRECHSLER, M ;

RAMDANI, S ;

CLAVERIE, A ;

MAAS, A .

JOURNAL DE PHYSIQUE, 1987, 48 (C-6) :209-214

[8] PREPARATION OF CONTAMINATION-FREE TUNGSTEN SPECIMENS FOR FIELD-ION MICROSCOPE [J].

FASTH, JE ;

LOBERG, B ;

NORDEN, H .

JOURNAL OF SCIENTIFIC INSTRUMENTS, 1967, 44 (12) :1044-&

[9] TIP SHARPENING BY NORMAL AND REVERSE ELECTROCHEMICAL ETCHING [J].

FOTINO, M .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (01) :159-167

[10] TRANSMISSION ELECTRON-MICROSCOPY OF SCANNING TUNNELING TIPS [J].

GARNAES, J ;

KRAGH, F ;

MORCH, KA ;

THOLEN, AR .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01) :441-444

← 1 2 3 →