Variable length scale analysis of surface topography: characterization of titanium surfaces for biomedical applications

被引：73

作者：

Chauvy, PF ^{[1
]}

Madore, C ^{[1
]}

Landolt, D ^{[1
]}

机构：

[1] Ecole Polytech Fed Lausanne, Dept Mat, Lab Met Chim, MXC Ecublens, CH-1015 Lausanne, Switzerland

来源：

SURFACE & COATINGS TECHNOLOGY | 1998年 / 110卷 / 1-2期

关键词：

titanium; topography; surface treatments; biomedical applications;

D O I：

10.1016/S0257-8972(98)00608-2

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A method for characterizing the surface topography at several length scales is presented. The analysis is based on a log-log representation of a characteristic roughness parameter versus the length scale. It is applicable to fractal and non-fractal surfaces. The potential of the method is evaluated by applying it to the characterization of computed self-affine fractal profiles of different fractal dimension. Profiles of titanium surfaces with different morphologies were measured with an optical profilometer and with an atomic force microscope. Variable length scale analysis of the data was performed for the roughness parameters root mean square deviation, skewness and kurtosis. Results show that the proposed method of data evaluation yields detailed information on length scale dependent surface topography, not available with classical roughness determinations. (C) 1998 Elsevier Science S.A. All rights reserved.

引用

页码：48 / 56

页数：9

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