Dielectric and electrical properties of sol-gel/DNA blends
被引:4
作者:
Norwood, R. A.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Arizona, Coll Opt Sci, 1630 E Univ Blvd, Tucson, AZ 85721 USAUniv Arizona, Coll Opt Sci, 1630 E Univ Blvd, Tucson, AZ 85721 USA
Norwood, R. A.
[1
]
DeRose, C. T.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Arizona, Coll Opt Sci, 1630 E Univ Blvd, Tucson, AZ 85721 USAUniv Arizona, Coll Opt Sci, 1630 E Univ Blvd, Tucson, AZ 85721 USA
DeRose, C. T.
[1
]
Himmelhuber, R.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Arizona, Coll Opt Sci, 1630 E Univ Blvd, Tucson, AZ 85721 USAUniv Arizona, Coll Opt Sci, 1630 E Univ Blvd, Tucson, AZ 85721 USA
Himmelhuber, R.
[1
]
Peyghambarian, N.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Arizona, Coll Opt Sci, 1630 E Univ Blvd, Tucson, AZ 85721 USAUniv Arizona, Coll Opt Sci, 1630 E Univ Blvd, Tucson, AZ 85721 USA
Peyghambarian, N.
[1
]
Wang, J.
论文数: 0引用数: 0
h-index: 0
机构:
TIPD LLC, Tucson, AZ USAUniv Arizona, Coll Opt Sci, 1630 E Univ Blvd, Tucson, AZ 85721 USA
Wang, J.
[2
]
Li, L.
论文数: 0引用数: 0
h-index: 0
机构:
TIPD LLC, Tucson, AZ USAUniv Arizona, Coll Opt Sci, 1630 E Univ Blvd, Tucson, AZ 85721 USA
Li, L.
[2
]
Ouchen, F.
论文数: 0引用数: 0
h-index: 0
机构:
US Air Force, Res Lab, Dayton, OH USAUniv Arizona, Coll Opt Sci, 1630 E Univ Blvd, Tucson, AZ 85721 USA
Ouchen, F.
[3
]
Grote, J. E.
论文数: 0引用数: 0
h-index: 0
机构:
US Air Force, Res Lab, Dayton, OH USAUniv Arizona, Coll Opt Sci, 1630 E Univ Blvd, Tucson, AZ 85721 USA
Grote, J. E.
[3
]
机构:
[1] Univ Arizona, Coll Opt Sci, 1630 E Univ Blvd, Tucson, AZ 85721 USA
[2] TIPD LLC, Tucson, AZ USA
[3] US Air Force, Res Lab, Dayton, OH USA
来源:
NANOBIOSYSTEMS: PROCESSING, CHARACTERIZATION, AND APPLICATIONS II
|
2009年
/
7403卷
基金:
美国国家科学基金会;
关键词:
sol-gel;
DNA;
capacitor;
dielectric breakdown;
energy storage;
polymer blends;
D O I:
10.1117/12.830978
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
We investigate the dielectric and electrical properties of sol-gel/DNA-CTMA blends, with particular interest in capacitor applications in energy storage. Methacryloyloxypropyltrimethoxysilane (MAPTMS) was the sol-gel precursor, and DNA-CTMA was blended in to the resulting sol-gel at 5 weight%. The blend was then tested for its dielectric properties and dielectric breakdown strength; at frequencies below 10kHz the blend was found to have a dielectric constant in the range of 7.5, while the breakdown strength was greater than 800 V/mu m, an exceptional value. We discuss these results as well as other aspects of the dielectric and electrical properties of these blends.
机构:Korea Inst Sci & Technol, Optoelect Mat Res Ctr, Seoul 136791, South Korea
Ahn, Young Rack
Park, Chong Rae
论文数: 0引用数: 0
h-index: 0
机构:Korea Inst Sci & Technol, Optoelect Mat Res Ctr, Seoul 136791, South Korea
Park, Chong Rae
Jo, Seong Mu
论文数: 0引用数: 0
h-index: 0
机构:Korea Inst Sci & Technol, Optoelect Mat Res Ctr, Seoul 136791, South Korea
Jo, Seong Mu
Kim, Dong Young
论文数: 0引用数: 0
h-index: 0
机构:
Korea Inst Sci & Technol, Optoelect Mat Res Ctr, Seoul 136791, South KoreaKorea Inst Sci & Technol, Optoelect Mat Res Ctr, Seoul 136791, South Korea
机构:Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Dang, ZM
Lin, YH
论文数: 0引用数: 0
h-index: 0
机构:Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Lin, YH
Nan, CW
论文数: 0引用数: 0
h-index: 0
机构:
Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R ChinaTsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
机构:
Air Force Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USAAir Force Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Heckman, Emily M.
Grote, James G.
论文数: 0引用数: 0
h-index: 0
机构:Air Force Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Grote, James G.
Hopkins, F. Kenneth
论文数: 0引用数: 0
h-index: 0
机构:Air Force Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Hopkins, F. Kenneth
Yaney, Perry P.
论文数: 0引用数: 0
h-index: 0
机构:Air Force Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
机构:Korea Inst Sci & Technol, Optoelect Mat Res Ctr, Seoul 136791, South Korea
Ahn, Young Rack
Park, Chong Rae
论文数: 0引用数: 0
h-index: 0
机构:Korea Inst Sci & Technol, Optoelect Mat Res Ctr, Seoul 136791, South Korea
Park, Chong Rae
Jo, Seong Mu
论文数: 0引用数: 0
h-index: 0
机构:Korea Inst Sci & Technol, Optoelect Mat Res Ctr, Seoul 136791, South Korea
Jo, Seong Mu
Kim, Dong Young
论文数: 0引用数: 0
h-index: 0
机构:
Korea Inst Sci & Technol, Optoelect Mat Res Ctr, Seoul 136791, South KoreaKorea Inst Sci & Technol, Optoelect Mat Res Ctr, Seoul 136791, South Korea
机构:Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Dang, ZM
Lin, YH
论文数: 0引用数: 0
h-index: 0
机构:Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Lin, YH
Nan, CW
论文数: 0引用数: 0
h-index: 0
机构:
Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R ChinaTsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
机构:
Air Force Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USAAir Force Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Heckman, Emily M.
Grote, James G.
论文数: 0引用数: 0
h-index: 0
机构:Air Force Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Grote, James G.
Hopkins, F. Kenneth
论文数: 0引用数: 0
h-index: 0
机构:Air Force Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Hopkins, F. Kenneth
Yaney, Perry P.
论文数: 0引用数: 0
h-index: 0
机构:Air Force Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA