Low-frequency noise measurements of high-Tc superconducting films:: effect of DC capacitor in experimental setup

被引:1
作者
Aslam, S. [1 ]
Jones, H. [2 ]
Lakew, B. [2 ]
机构
[1] MEI Technol, Seabrook, MD 20706 USA
[2] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA
关键词
D O I
10.1049/el:20072102
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Often a transformer is used with a DC-blocking capacitor as a voltage gain stage in experimental setups that measure low-frequency noise in high-T-c superconducting films. Presented is a system response analysis to show that the value of the DC-blocking capacitor determines the validity of the lower frequency limit of the measured noise voltage spectral density data.
引用
收藏
页码:1320 / 1321
页数:2
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