Structural, electrical and optical properties of Tb doped bismuth sodium titanate

The polycrystalline samples of (TbxBi1-x)(0.5)Na0.5TiO3 (x = 0.0, 0.01, 0.02 and 0.03) were prepared using a solid-state reaction technique. The formation of the desired materials and their structural properties were carried out by using the X-ray diffractions. Scanning electron microscope confirms the polycrystalline nature of the samples contain uniform grain distribution of unequal size. Temperature-frequency dependence of dielectric studies shows a dielectric anomaly or phase transition in the materials in the studied temperature range. Analysis of complex impedance data has provided the amount of contributions of grain/grain boundary in the materials resistance. This analysis also shows that that the system has negative temperature coefficient of resistance type behavior. The presence of functional group was confirmed by Fourier transform infrared spectroscopy. The dominant bands in the Raman spectra are analyzed by observing the changes in their respective peak position, width and intensities as the x increases.