Strong tip effects in near-field scanning optical tomography

被引：33
作者：
Sun, Jin [1 ]
Carney, P. Scott
Schotland, John C.
机构：
[1] Univ Illinois, Dept Elect & Comp Engn, Coordinated Sci Lab, Urbana, IL 61801 USA
[2] Univ Penn, Dept Bioengn, Philadelphia, PA 19104 USA
来源：
JOURNAL OF APPLIED PHYSICS | 2007年 / 102卷 / 10期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1063/1.2812545
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A model for the interaction of the scanning probe in near-field scanning optical microscopy is presented. Multiple scattering of the illuminating field with the probe is taken into account. The implications of this so-called strong tip model for the solution of the associated inverse scattering problem are studied through simulations. (c) 2007 American Institute of Physics.
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页数：9
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